Connector performance

Purchasing connectors, Konnra Electronics can be trusted! As people's requirements for trouble-free performance of electronic products continue to increase, the life of the connector is the primary indicator to measure the reliability of the connector performance, in the design, improve the life of the connector Become a design orientation. At the same time, the intensification of market competition, the search for suitable materials in non-expensive alloys, has become the primary choice for engineers to reduce the cost of connectors. In many cases, the combined result of these trends makes the copper alloy's operating characteristics of the connector closer to its performance limits.

Initial contact force is an important factor in connector design and material properties. Since the elastic deformation is converted into plastic deformation in the contact member, the stress release causes a decrease in the contact force. If the contact force is below a certain critical level, the contact will fail. Therefore, predicting stress relief as a function of time and temperature correlation is naturally a key factor in ensuring connector reliability. The following is a detailed description of the stress release test to predict the life of the connector.

(Image from Internet)

Stress release data is an effective tool for designers to predict the useful life of electronic connectors and to make decisions about the choice of contact materials based on available data. These data are now widely used in the computer, communications and automotive electronics industries. At present, data on the life cycle of products is very scarce, especially in the computer field. Not only that, it is a more useful piece of data that shortens the product development cycle and expiration date.
Most connector designers use stress-releasing data primarily to narrow the choice of contact material to the application. However, many designers are also looking for appropriate test methods to more accurately predict the characteristics of the connector's useful life. This greatly reduces the number of samples required for testing and the associated costs associated with testing many samples.
At present, most of the automotive connectors in harsh environments and in the hood are designed with 3 or 1 design specifications; the operating temperature of the next generation of automotive connectors is expected to increase. Only most non-automotive connectors do not seem to need to maintain their stability under the above conditions. However, high-density connectors require a lower initial insertion force, which in turn reduces the amount of stress released. This makes stress release an important property even at lower temperatures.
The standard assay time required for test data related to a particular application is generally difficult to determine accurately. At the desired service temperature, the test time between 1000h and 3000h can be used to evaluate the characterization data of automotive electronics. There are indications that people have been paying more and more attention to the characteristic data of 3000 to 5000 h (equivalent to 150,000 miles of service life). The calculation of the test data (without considering the change in slope) may lead to overestimation of the life of the contact and its overestimation will increase with time. The semi-logarithmic graphical representation of data at a particular temperature is currently the most widely used and is most urgently needed. This is also the easiest way to compare the various materials for a particular application. However, it is important to emphasize that the calculated data should be carefully examined and attention should be paid to the possibility of an overestimation of life expectancy.


The following conclusions were drawn in the stress release test:

1. Factors that contribute to the performance of the connector tending to the limit of alloy performance may continue to exist. This shows that accurate prediction of stress relief is the key to connector design.
2. When stress is used as a correlation function of test time, it is often found that the slope changes. Therefore, the test time should be lengthened to get this feature.
3. When the measured data has a certain correlation with temperature, it is very useful to linearize the existing data to a longer test time. The shortcoming is that when the test time exceeds the specified time, the slope turns sometimes, and the performance cannot be predicted at other temperatures.
4. In a single diagram, the Larsen-Miller parameter is very useful when plotting data curves at various temperatures. This method is also extremely useful for predicting the performance of materials between the two temperatures of completed and expected short-term tests and thereby simulating the long-term performance of the material. However, if the test temperature range is exceeded, it cannot be used to estimate it.
5. The two methods can be combined to re-examine the estimated values.
6. The rolling of the copper strip can simulate the manufacture of the connector, which has the opposite effect as the C7025 and C17410.
7. The data obtained from the strip has certain limitations. Since the bending is done during the manufacture of the connector, it does not reflect any negative effects.

Konnra Electronics has accumulated rich experience in the manufacture of connectors, and has a complete production line, which can effectively guarantee the advancement of the connector series orders, and timely delivery to the users, and we promise that all users should pay for each. The electronic connector product has a free warranty for one year, so users don't have to worry about after-sales problems. If you are looking for a connector partner, maybe we are a good choice. This article was originally edited by the Konnra Connector Operations team and declined to be reprinted for commercial use. We reserve the right to pursue legal liability if violations are discovered.